stuck-at-fault model

stuck-at-fault model
модель с постоянной неисправностью

English-Russian dictionary of microelectronics. 2014.

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  • Fault model — A fault model is an engineering model of something that could go wrong in the construction or operation of a piece of equipment. From the model, the designer or user can then predict the consequences of this particular fault. Fault models can be… …   Wikipedia

  • Stuck-at fault — A Stuck at fault is a particular fault model used by fault simulators and Automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical… …   Wikipedia

  • Fault coverage — refers to the percentage of some type of fault that can be detected during the test of an electronic system, usually an integrated circuit. High fault coverage is particularly valuable during manufacturing test, and techniques such as Design For… …   Wikipedia

  • Single Stuck Line — is a fault model used in digital circuits. It is used for post manufacturing testing, not design testing. The model assumes one line or node in the digital circuit is stuck at logic high or logic low. When a line is stuck it is called a fault.… …   Wikipedia

  • Fault friction — describes the relation of friction to fault mechanics. Rock failure and associated earthquakes are very much a fractal operation (see Characteristic earthquakes). The process remains scale invariant down to the smallest crystal. Thus, the… …   Wikipedia

  • Semiconductor fault diagnostics — are predictive software algorithms which are used to refine and localize the circuitry responsible for the failure of scan based devices. [cite conference| last=Crowell| first=G| coauthors=Press, R.| title=Using Scan Based Techniques for Fault… …   Wikipedia

  • Next Top Model (Greece), Cycle 2 — Next Top Model, Cycle 2 Genre Reality television Created by Tyra Banks Presented by Vicky Kaya Judges Vicky Kaya Jenny Balatsinou …   Wikipedia

  • Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… …   Wikipedia

  • Modèle de faute — Les modèles de faute sont des abstractions utilisées pour modéliser une défaut accidentel dans un circuit électronique (numérique). Chaque type de modèle de faute peut correspondre à plusieurs origines physiques différentes. Cette représentation… …   Wikipédia en Français

  • SSL — can refer to:In computing and electronics: * Secure Sockets Layer, a communications protocol, predecessor to Transport Layer Security * Server Side Language, a category of programming languages used on the web which execute on the server * S/SL… …   Wikipedia

  • 2009–2011 Toyota vehicle recalls — Two of the vehicles under recall: the Toyota Camry (top) and the Toyota Corolla Three separate but related recalls of automobiles by Toy …   Wikipedia


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